DocumentCode :
3417896
Title :
A large-scale SPC implementation using the IBM multimedia SPC program
Author :
Harrison, Mark ; Shapiro, Russ
Author_Institution :
IBM Technol. Products, Essex Junction, VT, USA
fYear :
1992
fDate :
30 Sep-1 Oct 1992
Firstpage :
153
Lastpage :
158
Abstract :
The implementation of statistical process control (SPC) in the chemical vapor deposition (CVD) process area of a semiconductor wafer fabricator is described. Advanced self-study interactive video/computer training and a series of cross-functional meetings were used for problem solving. The training that production employees received enabled them to enhance their basic statistical knowledge and skills, while cross-functional group meetings served as the vehicle for bringing that knowledge and experience together in the manufacturing environment to establish SPC online controls
Keywords :
chemical vapour deposition; computer based training; interactive video; multimedia systems; semiconductor technology; statistical process control; IBM multimedia SPC program; chemical vapor deposition; cross-functional meetings; large-scale SPC implementation; manufacturing environment; problem solving; production employees; self-study interactive video/computer training; semiconductor wafer fabricator; statistical process control; Computer graphics; Computerized monitoring; Control charts; Large-scale systems; Manufacturing; Mice; Personnel; Problem-solving; Process control; Production;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Semiconductor Manufacturing Conference and Workshop, 1992. ASMC 92 Proceedings. IEEE/SEMI 1992
Conference_Location :
Cambridge, MA
Print_ISBN :
0-7803-0740-2
Type :
conf
DOI :
10.1109/ASMC.1992.253778
Filename :
253778
Link To Document :
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