DocumentCode
3417920
Title
Theory and application of parameter self-optimizing intelligent sampling method
Author
Wencheng, Pan
Author_Institution
Sch. of Autom. & Electr. Eng., Zhejiang Univ. of Sci. & Technol., Hangzhou, China
fYear
2010
fDate
24-28 Oct. 2010
Firstpage
66
Lastpage
69
Abstract
Parameter self-optimizing sampling is a method of software synchronization. This paper further investigates correcting parameter self-optimizing on the basis of sampling parameter self-optimizing, analyzes its application in harmonic measuring. Using mountain-climb searching and the algorithms of traversal frequency points, it finds the sampling number N, the alternation Ts. The optimizing sampling parameters make it over 67% within power periods that the synchronous error is zero, and the asynchronous at the remainder are less than 3 Td (timer resolution of MPU), the sampling precision is to 10-5 magnitude order. The measurement error of self-optimizing sampling method approaches zero after correcting by k,. (correction parameter), only need consider the calculate error of 10-6 magnitude order by the quantification effect of kc word length. In self-optimizing, because no calculation exists during each sampling, the function of auto reloading initial value of microprocessor timer can be used, so it is proper equal interval sampling. In the last part of this paper, an application example in engineering is given, and takes ideas of “softer hardening” to meet real-time requirements.
Keywords
harmonic analysis; optimisation; parameter estimation; signal sampling; harmonic measuring; intelligent sampling method; measurement error; mountain-climb searching; parameter self-optimizing sampling; software synchronization; Frequency synchronization; Harmonic analysis; Measurement uncertainty; Sampling methods; Software; Time frequency analysis; Sampling parameter optimizing; correction parameter optimizing; mountain-climb searching; software synchronous sampling;
fLanguage
English
Publisher
ieee
Conference_Titel
Signal Processing (ICSP), 2010 IEEE 10th International Conference on
Conference_Location
Beijing
Print_ISBN
978-1-4244-5897-4
Type
conf
DOI
10.1109/ICOSP.2010.5656667
Filename
5656667
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