Title :
Test equipment correlation: a statistical approach
Author :
Kumar, Himanshu ; Erjavic, Scott
Author_Institution :
VLSI Technol. Inc., San Jose, CA, USA
fDate :
30 Sep-1 Oct 1992
Abstract :
A technique to effectively control equipment bias is discussed. The method relies on the control of the amount residuals and its deviation. It is generic and can be easily extended to various types of testers and/or any other measurement system which is continuously being used in production environment, thus making any R&R studies very infrequent, if at all possible
Keywords :
production testing; test equipment; amount residuals; equipment bias; equipment correlation; measurement system; production environment; statistical approach; test equipment; testers; Circuit testing; Delay; Hardware; Logic circuits; Logic devices; Logic testing; Production; Relays; Shift registers; Test equipment;
Conference_Titel :
Advanced Semiconductor Manufacturing Conference and Workshop, 1992. ASMC 92 Proceedings. IEEE/SEMI 1992
Conference_Location :
Cambridge, MA
Print_ISBN :
0-7803-0740-2
DOI :
10.1109/ASMC.1992.253784
