DocumentCode
3418030
Title
Test equipment correlation: a statistical approach
Author
Kumar, Himanshu ; Erjavic, Scott
Author_Institution
VLSI Technol. Inc., San Jose, CA, USA
fYear
1992
fDate
30 Sep-1 Oct 1992
Firstpage
121
Lastpage
126
Abstract
A technique to effectively control equipment bias is discussed. The method relies on the control of the amount residuals and its deviation. It is generic and can be easily extended to various types of testers and/or any other measurement system which is continuously being used in production environment, thus making any R&R studies very infrequent, if at all possible
Keywords
production testing; test equipment; amount residuals; equipment bias; equipment correlation; measurement system; production environment; statistical approach; test equipment; testers; Circuit testing; Delay; Hardware; Logic circuits; Logic devices; Logic testing; Production; Relays; Shift registers; Test equipment;
fLanguage
English
Publisher
ieee
Conference_Titel
Advanced Semiconductor Manufacturing Conference and Workshop, 1992. ASMC 92 Proceedings. IEEE/SEMI 1992
Conference_Location
Cambridge, MA
Print_ISBN
0-7803-0740-2
Type
conf
DOI
10.1109/ASMC.1992.253784
Filename
253784
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