DocumentCode :
3418062
Title :
The Effects of ESD in Multiple Testing Environments on Adhesive-Label RFID Tags
Author :
Bauer-Reich, C. ; Nelson, R.M. ; Vaselaar, D.
Author_Institution :
North Dakota State Univ., Fargo,
fYear :
2007
fDate :
9-13 July 2007
Firstpage :
1
Lastpage :
6
Abstract :
The purpose of this study was to determine the ESD susceptibility of commercially available label-enclosed RFID tags. Six different types of adhesive labels with RFID transponders were subjected to ESD in different testing environments. Initial data shows that most of the tags were sufficiently protected from fairly large discharges by their covering material. The magnitude of discharge and distance of the discharge to the IC did not have the expected effects on the tags. Instead, the presence of a ground plane and low label resistance were correlated to larger damage rates. The type of antenna and IC also played a role in susceptibility.
Keywords :
adhesives; electrostatic discharge; radiofrequency identification; transponders; ESD susceptibility; RFID transponders; adhesive-label RFID tags; electrostatic discharge; multiple testing environment; Circuits; Copper; Electrostatic discharge; Plastics; Power supplies; Protection; RFID tags; Radiofrequency identification; Testing; Transponders;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 2007. EMC 2007. IEEE International Symposium on
Conference_Location :
Honolulu, HI
Print_ISBN :
1-4244-1349-4
Electronic_ISBN :
1-4244-1350-8
Type :
conf
DOI :
10.1109/ISEMC.2007.172
Filename :
4305752
Link To Document :
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