Title :
Working 225 V Over-Voltage Protection Cell With Tunable Trigger and Holding Voltages for Latch-Up Immunity
Author :
Coyne, Edward John
Author_Institution :
Analog Devices, Process Dev., Limerick, Ireland
Abstract :
This paper describes the challenges encountered and solutions found to be the problem of developing over-voltage protection for 225 V circuit applications with measured tunable trigger voltages of 100-300 V, measured tunable holding voltages for latch-up immunity of 50-240 V, and corresponding strengths of 8.0-2.4 A Transmission Line Pulse (TLP). The device is engineered using technical computer-aided design and the performance is measured with dc characterization, unpowered TLP, powered and unpowered Electrostatic Discharge (ESD), as well as a 225 V product placement with a 1500-h High Temperature Operating Life lifetime reliability monitor. The final cell enables both 225 V powered and unpowered protection from high voltage switching transients and ESD events.
Keywords :
circuit analysis computing; circuit reliability; electrostatic discharge; overvoltage protection; power supply circuits; technology CAD (electronics); thyristors; transmission lines; ESD events; SCR; TLP; current 8.0 A to 2.4 A; dc characterization; electrostatic discharge; high temperature operating life lifetime reliability monitor; high voltage switching transients; holding voltages; latch-up immunity; power supply node; silicon controlled rectifier; technical computer-aided design; time 1500 h; transmission line pulse; tunable trigger voltage; voltage 100 V to 300 V; voltage 50 V to 240 V; working overvoltage protection cell; Electrostatic discharges; Impedance; Layout; Metals; Power supplies; Transient analysis; Voltage measurement; Over-voltage protection; reduced surface field (RESURF); silicon controlled rectifier (SCR); technical computer-aided design (TCAD); ultrahigh voltage circuit;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/TED.2013.2271812
