DocumentCode
3418336
Title
Yield and productivity management
Author
Effron, Melvyn S.
Author_Institution
IBM Corp., Essex Junction, VT, USA
fYear
1992
fDate
30 Sep-1 Oct 1992
Firstpage
1
Abstract
Summary form only given. The approaches, attitudes, and methodologies used by over 20 semiconductor manufacturers to manage yield and improve productivity have been examined. Selected topics in management systems and measurements, long- and short-loop analysis, data and information generation and handling, and manufacturing operational procedures have been considered
Keywords
management; semiconductor device manufacture; information generation; long-loop analysis; management systems; operational procedures; productivity; semiconductor manufacturers; short-loop analysis; yield; Computer integrated manufacturing; Conference management; Databases; Engineering management; Environmental management; Information analysis; Pareto analysis; Productivity; Quality management; Semiconductor device manufacture;
fLanguage
English
Publisher
ieee
Conference_Titel
Advanced Semiconductor Manufacturing Conference and Workshop, 1992. ASMC 92 Proceedings. IEEE/SEMI 1992
Conference_Location
Cambridge, MA
Print_ISBN
0-7803-0740-2
Type
conf
DOI
10.1109/ASMC.1992.253808
Filename
253808
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