• DocumentCode
    3418351
  • Title

    Practical pressure measurement using MEMS

  • Author

    Jones, Roger

  • fYear
    2005
  • fDate
    38467
  • Abstract
    Early pressure measuring equipment relied on a mechanism to translate the deflection of a structure into the motion of a pointer against a dial. Examples of this are the aneroid barometer and the Bourdon tube pressure gauge. However, with the move towards automated monitoring and control the requirement arose for pressure transducers with an electrical output. Initially this requirement was satisfied by the addition of an electrical position transducer to the mechanical structure, resulting in a complex and expensive assembly. Silicon MEMS is an ideal technology for pressure measurement because the same silicon element performs the two functions of a linear, repeatable mechanical structure and also an electronic strain gauge transducer. Combined with the low production cost afforded by wafer scale manufacture silicon MEMS has developed over the last 30 years to be the technology of choice for pressure measurement.
  • Keywords
    elemental semiconductors; microsensors; pressure measurement; pressure transducers; silicon; strain gauges; Bourdon tube pressure gauge; aneroid barometer; automated control; automated monitoring; electrical output; electrical position transducer; electronic strain gauge transducer; linear repeatable mechanical structure; pressure measurement; pressure measuring equipment; pressure transducers; silicon MEMS; structure deflection;
  • fLanguage
    English
  • Publisher
    iet
  • Conference_Titel
    MEMS Sensor Technologies, 2005. The IEE Seminar and Exhibition on
  • ISSN
    0537-9989
  • Print_ISBN
    0-86341-523-7
  • Type

    conf

  • DOI
    10.1049/ic:20050110
  • Filename
    1453354