• DocumentCode
    3418393
  • Title

    High-speed photo-modulated spindt cathode for FELs

  • Author

    Holland, Christopher ; Schwoebel, Paul ; Todd, K. ; Spindt, Capp ; Smith, Tim

  • Author_Institution
    SRI Int., Menlo Park, CA, USA
  • fYear
    2013
  • fDate
    8-12 July 2013
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    SRI International is integrating a Spindt-type field-emission source with a high-mobility GaN photoconducting semiconductor switch (PCSS) to develop cathodes capable of producing Ampere-level currents in the picosecond pulse regime. Semi-insulating Fe-doped GaN was selected for this application because of its high breakdown voltage, low resistance, and high carrier mobility. Both thin-film and bulk GaN are being investigated. Measurements of GaN carrier lifetime have shown that switch response times of 3-50 ps should be possible. Initial PCSS measurements with a moderate power femtosecond laser operating between 400-530 nm are limited by instrumentation but have shown sub-100 ps switch rise times. Subnanosecond field-emission current modulation has also been measured. A radiofrequency (RF) cavity based streak camera is being developed to measure the electron beam´s pulse width.
  • Keywords
    III-V semiconductors; carrier mobility; electric breakdown; field emission; free electron lasers; gallium compounds; photocathodes; photoconducting switches; semiconductor doping; wide band gap semiconductors; Ampere-level currents; FELs; Fe; GaN; GaN carrier lifetime measurements; PCSS; RF cavity; SRI International; breakdown voltage; bulk GaN; carrier mobility; cathodes; electron beam pulse width measurement; free-electron laser; high-speed photo-modulated spindt cathode; photoconducting semiconductor switch; picosecond pulse regime; power femtosecond laser; radiofrequency cavity; semiinsulating Fe-doped GaN; spindt-type field-emission source; streak camera; subnanosecond field-emission current modulation; thin-film GaN; time 3 ps to 50 ps; Cathodes; Gallium nitride; Measurement by laser beam; Optical switches; Resistance; Semiconductor device measurement; Field-emission cathode; GaN; Spindt cathode; free-electron laser; photoconducting semiconductor switch;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Nanoelectronics Conference (IVNC), 2013 26th International
  • Conference_Location
    Roanoke, VA
  • Type

    conf

  • DOI
    10.1109/IVNC.2013.6624710
  • Filename
    6624710