• DocumentCode
    3418459
  • Title

    Progress with developing theory for fowler-nordheim plot interpretation

  • Author

    Forbes, Richard G. ; Deane, Jonathan H. B.

  • Author_Institution
    Dept. of Electron. Eng., Univ. of Surrey, Guildford, UK
  • fYear
    2013
  • fDate
    8-12 July 2013
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    The work described in this conference talk follows up recent work on the development of a test for lack of field emission orthodoxy. There are three stages of discussion involved. First, the results of applying the test to 17 selected published FN plots are reported. About half fail the test, showing that related published field enhancement factor (FEF) values are unreliable. In several cases, this failure is probably related to plot “saturation” associated with series resistance. Thus, second, we have explored how to calculate a “slope correction factor for the case of constant series resistance”. This can be done, but the outcome is not useful. Third, we briefly outline other conceivable routes to more accurate extraction or characterization of “true physical FEFs”, and suggest that systematic simulation experiments on all or some of these might be of interest.
  • Keywords
    electric resistance; electron field emission; FEF values; FN plots; Fowler-Nordheim plot interpretation; constant series resistance; field electron emission; field emission orthodoxy; field enhancement factor; plot saturation; slope correction factor; Current measurement; Electrical resistance measurement; Equations; Materials; Mathematical model; Resistance; Voltage measurement; Field electron emission; Fowler-Nordheim plots; field emission orthodoxy test; saturation; series resistance; slope correction factors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Nanoelectronics Conference (IVNC), 2013 26th International
  • Conference_Location
    Roanoke, VA
  • Type

    conf

  • DOI
    10.1109/IVNC.2013.6624714
  • Filename
    6624714