• DocumentCode
    3418501
  • Title

    Materials mechanics and mechanical reliability of flip chip assemblies on organic substrates

  • Author

    Schubert, A. ; Dudek, R. ; Michel, B. ; Reichl, H. ; Jiang, H.

  • Author_Institution
    Fraunhofer Inst. for Reliability & Microintegration, Berlin, Germany
  • fYear
    1997
  • fDate
    9-12 Mar 1997
  • Firstpage
    106
  • Lastpage
    109
  • Abstract
    This paper demonstrates a combined approach of numerical analysis and experimental investigations to study the mechanical reliability of flip chip solder joints. The effect of various design parameters like bump geometry, “soft” and “hard” underfill, and used solder mask on the thermal fatigue life of solder joints is discussed. Since special attention has been directed towards Flip Chip on Board (FCOB) assemblies, constitutive properties of polymeric and solder materials are discussed in detail. The solder is modeled using a nonlinear constitutive law with time dependent (creep) and time independent plastic strains. Furthermore, material testing shows that the underfill and solder mask materials might be considered as linear viscoelastic with temperature time shift properties. Thermal mismatch between the materials assembled is often the main reason for thermally induced stresses. Thermal cycling (125°C...-55°C...125°C) is therefore the load generally used in the 3D non-linear finite element analysis. Calculation results of the solder bump deformation due to temperature changes are accompanied by experimental deformation analysis. The used MicroDAC method is based on algorithms of local object tracking in images obtained from electron scanning microscopy. The measured deformation fields were utilized for proper materials selection and processing, as well as for verification of finite element analysis
  • Keywords
    finite element analysis; flip-chip devices; plastic deformation; reliability; scanning electron microscopy; soldering; thermal stresses; -55 to 125 C; 3D finite element analysis; FCOB; MicroDAC method; bump deformation; creep; flip chip assembly; linear viscoelasticity; mask; materials mechanics; mechanical reliability; nonlinear constitutive relation; organic substrate; plastic strain; polymer; scanning electron microscopy; solder joint; thermal cycling; thermal fatigue life; thermal mismatch; thermal stress; underfill; Assembly; Fatigue; Finite element methods; Flip chip; Flip chip solder joints; Geometry; Materials reliability; Numerical analysis; Temperature; Thermal stresses;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Packaging Materials. Proceedings., 3rd International Symposium on
  • Conference_Location
    Braselton, GA
  • Print_ISBN
    0-7803-3818-9
  • Type

    conf

  • DOI
    10.1109/ISAPM.1997.581268
  • Filename
    581268