Title :
Properties of Fields in Reverberant Environments and its Implications
Author :
Perini, Jose ; Perini, Patrick
Author_Institution :
J Perini Consulting, Daytona Beach
Abstract :
This paper addresses fields in reverberant environments, where many reflections exist, showing that they are elliptically polarized. To calculate the correct peak fields from measurements, or simulations, it is then necessary to know the amplitudes and phases of the fields Cartesian Components (CCs). Since today´s field probes do not have phase information it is not possible to measure the correct peak exposures. The usual sum of the squares of the CCs magnitudes may be as much as 50% off. Yet this is commonly used with no qualifications. As an example, in the statistical characterization of these fields, the CCs are assumed to be statistically independent variables with normal distribution leading to the Rayleigh distribution for the peak far field, and the Exponential distribution for the peak square near field. In both cases the wrong variable, the sum of the appropriate CCs square magnitudes, is used. The paper also shows that the CCs are not statistically independent variables. The correct equations to calculate the peak values are derived. A suggestion of how to modify the present day probes to measure the CCs phases is also presented. All these questions are discussed in detail. Key words: Reverberant Environment Fields, Reverberation Chambers, Phasors, and Field Probes.
Keywords :
electromagnetic compatibility; exponential distribution; Cartesian components; Rayleigh distribution; exponential distribution; fields properties; peak square near field; reverberant environments; reverberation chambers; statistical characterization; Carbon capture and storage; Equations; Exponential distribution; Gaussian distribution; Phase measurement; Polarization; Probes; Qualifications; Reflection; Reverberation chamber;
Conference_Titel :
Electromagnetic Compatibility, 2007. EMC 2007. IEEE International Symposium on
Conference_Location :
Honolulu, HI
Print_ISBN :
1-4244-1349-4
Electronic_ISBN :
1-4244-1350-8
DOI :
10.1109/ISEMC.2007.198