Title :
Modelling of a Mixed Signal Processor Susceptibility to Near-Field Aggression
Author :
Boyer, A. ; Bendhia, S. ; Sicard, E.
Author_Institution :
INSA, Toulouse
Abstract :
This paper deals with measurement and modelling of the susceptibility of an integrated analog to digital converter of a 16 bit microcontroller to near-field localized aggression using a miniature near-field probe. A predictive simulation of the susceptibility threshold is detailed comparison between experimental and simulation results shows interesting correlations between measured and simulated susceptibility thresholds.
Keywords :
analogue-digital conversion; digital signal processing chips; microcontrollers; integrated analog-to-digital converter; integrated circuits; microcontroller; miniature near-field probe; mixed signal processor; near-field aggression; susceptibility threshold; Analog integrated circuits; Analog-digital conversion; Circuit simulation; Digital integrated circuits; Integrated circuit measurements; Microcontrollers; Predictive models; Probes; Signal processing; Testing;
Conference_Titel :
Electromagnetic Compatibility, 2007. EMC 2007. IEEE International Symposium on
Conference_Location :
Honolulu, HI
Print_ISBN :
1-4244-1349-4
Electronic_ISBN :
1-4244-1350-8
DOI :
10.1109/ISEMC.2007.209
