DocumentCode
3419141
Title
A bipartite graph approach to generate optimal test sequences for protocol conformance testing using the Wp-method
Author
Wang, Jun ; Xiao, Jitian ; Lam, Chiou Peng ; Li, Huaizhong
Author_Institution
Sch. of Comput. Sci. & Comput. Eng., Wenzhou Univ., China
fYear
2005
fDate
15-17 Dec. 2005
Abstract
Conformance testing using test sequences is used to ensure that a protocol implementation conforms to its specification. A commonly used technique to generate test sequences for specifications described by the finite state machines is the Wp-method with the reset technique, which frequently results in long test sequences. In this paper, we propose a bipartite graph approach to generate optimal test sequences for protocol conformance testing. Our approach significantly reduces the length of the test sequences required for conformance testing while maintaining the same fault detection capability.
Keywords
conformance testing; finite state machines; formal specification; graph theory; protocols; sequences; Wp-method; bipartite graph approach; fault detection capability; finite state machines; optimal test sequences; protocol conformance testing; reset technique; Automata; Bipartite graph; Communication system control; Computer science; Control systems; Fault detection; Fellows; Information science; Protocols; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Software Engineering Conference, 2005. APSEC '05. 12th Asia-Pacific
ISSN
1530-1362
Print_ISBN
0-7695-2465-6
Type
conf
DOI
10.1109/APSEC.2005.5
Filename
1607166
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