The topografiner with energy analysis

The topografiner technology, developed originally at the National Bureau of Standards (now National Institute of Standards and Technology) with the aim of measuring the surface micro-topography, is less widespread than scanning tunneling microscopy but has a remarkable property: the electrons can escape the tip-surface junction. We have recently used topografiner imaging to map the surface of various metals and semiconductors with (almost) nanometer lateral spatial resolution. In this paper, we describe our attempt to endowing the NIST topografiner with an energy analysis of the electrons escaping the junction, with the aim of performing spectroscopy with nanometer spatial resolution.