DocumentCode :
3419447
Title :
Integrating generalized Weibull-type testing-effort function and multiple change-points into software reliability growth models
Author :
Lin, Chu-Ti ; Huang, Chin-Yu ; Chang, Jun-Ru
Author_Institution :
Dept. of Comput. Sci., Nat. Tsing Hua Univ., Hsinchu, Taiwan
fYear :
2005
fDate :
15-17 Dec. 2005
Abstract :
In modern societies, software is everywhere and we need software to be reliable. In practice, during software development processes, software reliability assessment can greatly help managers to understand effectiveness of consumed testing-effort and deploy testing-resource. In the 1970s-2000, many software reliability growth models (SRGMs) have been proposed for estimation of reliability growth of software products. In this paper, the concept of multiple change-points is incorporated into Weibull-type testing-effort dependent SRGM because the consumption phenomenon of testing resource may vary at some moments. The performance and application of proposed models are demonstrated through one real data set. The experimental results show that the models give an excellence performance on failure prediction. Besides, we also discuss the optimal release time problems based on reliability requirement and cost criteria.
Keywords :
Weibull distribution; program testing; project management; software cost estimation; software reliability; cost criteria; failure prediction; generalized Weibull-type testing-effort function; multiple change-points; optimal release time problem; software development process; software reliability growth model; Application software; Computer errors; Costs; Hardware; Programming; Software reliability; Software systems; Software testing; Switches; Tellurium;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Software Engineering Conference, 2005. APSEC '05. 12th Asia-Pacific
ISSN :
1530-1362
Print_ISBN :
0-7695-2465-6
Type :
conf
DOI :
10.1109/APSEC.2005.74
Filename :
1607180
Link To Document :
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