Title :
A multiple model approach to doubly-selective channel estimation using exponential basis models
Author :
Song, Liying ; Tugnait, Jitendra K.
Author_Institution :
Dept. of Electr. & Comput. Eng., Auburn Univ., Auburn, AL
fDate :
March 31 2008-April 4 2008
Abstract :
An adaptive channel estimation scheme, exploiting the over-sampled complex exponential basis expansion model (CE-BEM), is presented for doubly-selective channels where we track the BEM coefficients via a multiple model approach. In the past work the number of BEM coefficients used to model the doubly-selective channels for channel estimation has been based on an upperbound on the channel Doppler spread. Higher the Doppler spread, more the number of BEM coefficients leading to higher channel estimation variance. In this paper we propose to use a multiple model framework where several candidate Doppler spread values are used to cover the range from zero to an upperbound, leading to multiple CE-BEM channel models, each corresponding to an assumed value of the Doppler spread. Subsequently the well- known interacting multiple model (IMM) algorithm is used for symbol detection based on multiple state-space models corresponding to the multiple estimated channels. A simulation example is presented to illustrate the proposed approach.
Keywords :
Doppler broadening; channel estimation; fading channels; probability; signal detection; BEM coefficients; CE-BEM channel models; adaptive channel estimation; channel Doppler spread; doubly-selective channel estimation; exponential basis models; interacting multiple model; multiple model approach; multiple state-space models; over-sampled complex exponential basis expansion model; symbol detection; Bit error rate; Channel estimation; Finite impulse response filter; Frequency; Polynomials; Receiving antennas; State estimation; Time factors; Time-varying channels; Vectors; Doubly-selective channels; IMM algorithm; adaptive channel estimation; basis expansion models;
Conference_Titel :
Acoustics, Speech and Signal Processing, 2008. ICASSP 2008. IEEE International Conference on
Conference_Location :
Las Vegas, NV
Print_ISBN :
978-1-4244-1483-3
Electronic_ISBN :
1520-6149
DOI :
10.1109/ICASSP.2008.4518399