Comparative Study of Electrode Geometry Affects on Corona Onset and Schottky Diode Breakdown

A variety of methods were used to strengthen the electrically stressed regions of the Schottky diode contacts in order to prevent EMI due to electron avalanche breakdowns and ESD damages. This paper will present how planar and spherical geometry of the Schottky contact will affect the high voltage performance of the devices. Different electrodes geometries are tested with voltage up to 18 kV and corona discharges are photographed. Both experimental data and finite element analysis indicate that spherical geometry has the best performances for breakdowns. Sub micrometer wire, geometries that degrade performance are also tested and simulated.