DocumentCode :
3419553
Title :
The effect of barrier form on slope and intercept correction factors for curved emitters: Development of some enabling theory
Author :
Fischer, Anath ; Mousa, Marwan S. ; Deane, Jonathan H. B. ; Forbes, Richard G.
Author_Institution :
Inst. fur Phys., Tech. Univ. Chemnitz, Chemnitz, Germany
fYear :
2013
fDate :
8-12 July 2013
Firstpage :
1
Lastpage :
2
Abstract :
The work described in this conference poster follows up recent work on the interpretation of Fowler-Nordheim (FN) plots. It puts in place some enabling theory that should allow further development of plot interpretation theory, in the context of the sphere-on-orthogonal-cone (SOC) emitter model. This model is expected to be more suitable, for small-apex-radius emitters, than the spherical-emitter (SPH) model. First, this report shows (as expected) that use of the spherical image-potential-energy formula, rather than the planar formula, appears to make little difference to the values of calculated parameters. Second, values of the exponent n (in the SOC model) are tabulated as a function of internal cone half-angle. Third, an expression is derived for the electrostatic component of electron motive energy, in the SOC model. Finally, the results of a sample calculation are presented. This compares values of the slope correction factor σ for the SPH and SOC models, for emitter-radius values 20 nm and 5 nm. As expected, the results for the two models are similar for 20 nm, but diverge as apex radius decreases.
Keywords :
electron field emission; electrostatics; Fowler-Nordheim plots; barrier form effect; curved emitters; electron motive energy; electrostatic component; intercept correction factor; planar formula; plot interpretation theory; slope correction factor; small apex radius emitters; sphere on orthogonal cone emitter model; spherical emitter model; spherical image potential energy formula; Context; Educational institutions; Electric potential; Electron emission; Electrostatic measurements; Electrostatics; System-on-chip; Field electron emission; Fowler-Nordheim plot; slope correction factor; sphere-on-orthogonal-cone emitter model;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Nanoelectronics Conference (IVNC), 2013 26th International
Conference_Location :
Roanoke, VA
Type :
conf
DOI :
10.1109/IVNC.2013.6624760
Filename :
6624760
Link To Document :
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