Title :
A power clamp circuit using current mirror for on-chip ESD protection
Author :
Guangyi Lu ; Yuan Wang ; Xuelin Zhang ; Song Jia ; Ganggang Zhang ; Xing Zhang
Author_Institution :
Key Lab. of Microelectron. Devices & Circuits (MoE), Peking Univ., Beijing, China
fDate :
Oct. 29 2012-Nov. 1 2012
Abstract :
A power clamp circuit using current mirror is proposed in this article. The current mirror is used for capacitance multiplication in the proposed circuit. Besides, the proposed circuit has different turn-on and turn-off paths towards clamp transistor and it employs a non-traditional phase inverter in the turn-on path of clamp transistor. Simulation results verify that the proposed circuit has enhanced ability to discharge static charges during an ESD event while making the ESD pulse detection CR time constant notably smaller. With the reduction of CR time constant, the proposed circuit has better immunity to mis-triggering and is less chip area-consuming.
Keywords :
capacitance; circuit simulation; current mirrors; electrostatic discharge; invertors; transistor circuits; CR time constant; ESD event; ESD pulse detection; capacitance multiplication; circuit simulation; clamp transistor; current mirror; electrostatic discharge; on-chip ESD protection; phase inverter; power clamp circuit; turn-off path; turn-on path; Capacitance; Clamps; Electrostatic discharges; Inverters; Logic gates; Mirrors; Transistors; Electrostatic discharge (ESD); current mirror; mis-triggering; power clamp circuit;
Conference_Titel :
Solid-State and Integrated Circuit Technology (ICSICT), 2012 IEEE 11th International Conference on
Conference_Location :
Xi´an
Print_ISBN :
978-1-4673-2474-8
DOI :
10.1109/ICSICT.2012.6467806