• DocumentCode
    3419680
  • Title

    A high sensitivity z-axis torsional silicon accelerometer

  • Author

    Selvakumar, A. ; Ayazi, F. ; Najafi, K.

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
  • fYear
    1996
  • fDate
    8-11 Dec. 1996
  • Firstpage
    765
  • Lastpage
    768
  • Abstract
    This paper presents a high sensitivity silicon micromachined capacitive accelerometer fabricated using a three mask, dissolved wafer process. High electrical sensitivity is obtained by using high aspect-ratio comb fingers with narrow air gaps of 2 /spl mu/m and large overlap area of 12 /spl mu/m/spl times/300 /spl mu/m. Torsional suspension beams 150 /spl mu/m long with a cross-sectional area of 12 /spl mu/m/spl times/3 /spl mu/m are used to improve the mechanical gain (form factor). By using a varying overlap area method, the dynamic range, the pull-in voltage and the bandwidth are improved. The fabricated accelerometers yielded sensitivities of 263-300 mV/g, a nonlinearity less than 0.2% over a range of -4 g to +3 g, a full scale range of -4 g to +6 g and pull-in voltages greater than 8 V. A 3-dB cut-off frequency of 30 Hz was measured in air. The minimum resolution measured by the readout electronics was 0.077 g.
  • Keywords
    accelerometers; capacitance measurement; elemental semiconductors; micromachining; microsensors; semiconductor technology; silicon; torsion; 150 mum; 2 mum; 3-dB cut-off frequency; 30 Hz; 8 V; Si; bandwidth improvement; cross-sectional area; dynamic range; form factor; high aspect-ratio comb fingers; high electrical sensitivity; high sensitivity Si micromachined capacitive accelerometer; high sensitivity z-axis torsional silicon accelerometer; mechanical gain; minimum resolution; narrow air gaps; nonlinearity; parallel plate sense mechanism; pull-in voltage; readout electronics; three mask dissolved wafer process; torsional suspension beams; varying overlap area method; Accelerometers; Air gaps; Bandwidth; Cutoff frequency; Dynamic range; Dynamic voltage scaling; Fingers; Frequency measurement; Readout electronics; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1996. IEDM '96., International
  • Conference_Location
    San Francisco, CA, USA
  • ISSN
    0163-1918
  • Print_ISBN
    0-7803-3393-4
  • Type

    conf

  • DOI
    10.1109/IEDM.1996.554092
  • Filename
    554092