DocumentCode
3419710
Title
Metrics evaluation of software reliability growth models
Author
Chan, Francis C L ; Dasiewicz, Paul P. ; Seviora, Rudolph E.
Author_Institution
Dept. of Electr. & Comput. Eng., Waterloo Univ., Ont., Canada
fYear
1991
fDate
17-18 May 1991
Firstpage
163
Lastpage
167
Abstract
Numerous software reliability growth models have been proposed. The authors present three metrics which have been helpful in assessing the applicability and predictive validity of these models. These metrics are the relative fitting error metric, the short term predictive validity metric and the long term predictive validity metric. The application of these three metrics is illustrated on estimation of field reliability of telecommunication switching systems
Keywords
quality control; software metrics; software reliability; switching systems; telecommunications computing; long term predictive validity metric; predictive validity; relative fitting error metric; short term predictive validity metric; software reliability growth models; telecommunication switching systems; Application software; Displays; Inverse problems; Maintenance; Parameter estimation; Predictive models; Software reliability;
fLanguage
English
Publisher
ieee
Conference_Titel
Software Reliability Engineering, 1991. Proceedings., 1991 International Symposium on
Conference_Location
Austin, TX
Print_ISBN
0-8186-2143-5
Type
conf
DOI
10.1109/ISSRE.1991.145373
Filename
145373
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