Title :
Time-domain optical sampling of nonlinear microwave amplifiers
Author :
Weiss, M. ; Crites, M. ; Bryerton, E. ; Whitaker, J. ; Popovic, Z.
Author_Institution :
Colorado Univ., CO, USA
Abstract :
Time domain measurements of the output waveforms of two 8-GHz high-efficiency power amplifiers are presented. A new photoconductive probe has enabled nonintrusive absolute voltage measurements which confirm switched-mode class-E and F operation. In order to analyze nonlinear amplifiers designed to deliver a sinusoidal wave to the load, voltages at characteristic points inside the circuit need to be known. The high-impedance probe used here is an optoelectronic sampler which can sense the charge on an exposed interconnect or the field associated with a buried interconnect. This field data is then converted into voltage.
Keywords :
microwave power amplifiers; photoconducting devices; probes; signal sampling; time-domain analysis; voltage measurement; 8 GHz; buried interconnect; characteristic points; exposed interconnect; high-efficiency power amplifiers; high-impedance probe; nonintrusive absolute voltage measurements; nonlinear microwave amplifiers; optoelectronic sampler; output waveforms; photoconductive probe; sinusoidal wave; switched-mode class-E operation; switched-mode class-F operation; time domain measurements; time-domain optical sampling; Integrated circuit interconnections; Microwave amplifiers; Nonlinear optics; Optical amplifiers; Probes; Sampling methods; Semiconductor optical amplifiers; Stimulated emission; Time domain analysis; Voltage;
Conference_Titel :
Microwave Symposium Digest, 1999 IEEE MTT-S International
Conference_Location :
Anaheim, CA, USA
Print_ISBN :
0-7803-5135-5
DOI :
10.1109/MWSYM.1999.779529