DocumentCode
3419931
Title
Solder joint reliability of flip chip and plastic ball grid array assemblies under thermal, mechanical, and vibration conditions
Author
Lau, John H.
Author_Institution
Hewlett-Packard Co., USA
fYear
1995
fDate
4-6 Dec 1995
Firstpage
13
Lastpage
19
Abstract
The thermal, mechanical and vibration responses of flip chip and PBGA (Plastic Ball Grid Array) solder joints have been determined in this study. The effects of overload environmental stress factors on the mechanical responses of the solder joints have been determined by bending and twisting experiments. The effects of shipping environmental stress factors on the vibration responses of the solder joints have been determined by out of plane vibration experiments. Also, the thermal fatigue behavior of solder joints have been investigated by nonlinear finite element, Coffin-Manson, and fracture mechanics methods
Keywords
bending; environmental degradation; finite element analysis; flip-chip devices; fracture mechanics; plastic packaging; reliability; soldering; thermal stress cracking; vibrations; Coffin-Manson method; bending; environmental stress factor; flip chip assembly; fracture mechanics; mechanical response; nonlinear finite element method; overload; plastic ball grid array assembly; shipping; solder joint reliability; thermal fatigue; twisting; vibration response; Assembly; Capacitive sensors; Electronics packaging; Fatigue; Flip chip; Plastics; Soldering; Thermal resistance; Thermal stresses; Vibrations;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Manufacturing Technology Symposium, 1995, Proceedings of 1995 Japan International, 18th IEEE/CPMT International
Conference_Location
Omiya
Print_ISBN
0-7803-3622-4
Type
conf
DOI
10.1109/IEMT.1995.540984
Filename
540984
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