• DocumentCode
    3420257
  • Title

    Si IC development for high efficiency envelope tracking power amplifiers

  • Author

    Asbeck, P. ; Larson, L. ; Kimball, D. ; Kwak, M. ; Hassan, M. ; Hsia, C. ; Presti, C. ; Scuderi, A.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of California, San Diego, La Jolla, CA, USA
  • fYear
    2012
  • fDate
    16-18 Jan. 2012
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Envelope tracking provides the potential for achieving high efficiency in power amplifiers for next generation wireless systems with high peak-to-average ratio signals such as LTE. Envelope modulators with low cost, high efficiency and wide bandwidth are critical enablers for the widespread application of ET. This presentation reviews the development of various Si ICs for ET applications in basestation PAs and in handset PAs. Requirements of voltage swing, bandwidth, and accuracy are first described. BCD technology-based Si ICs for envelope modulators achieving voltages as high as 50V are presented, for operation in basestations with LDMOS and GaN RF power transistors. CMOS-based Si envelope modulator ICs for operation in wireless handsets are also discussed. ET amplifiers that achieve overall efficiency as high as 45% in 20MHz LTE handset applications are presented.
  • Keywords
    CMOS integrated circuits; Long Term Evolution; modulators; monolithic integrated circuits; power amplifiers; silicon; BCD technology-based Si IC; CMOS-based Si envelope modulator IC; GaN RF power transistors; LDMOS; Si; basestation PA; envelope modulators; envelope tracking power amplifiers; handset PA; next generation wireless systems; peak-to-average ratio signals; voltage 50 V; Bandwidth; Integrated circuits; Multiaccess communication; Power amplifiers; Radio frequency; Switches; Switching circuits; CMOS integrated circuits; Envelope tracking; power amplifiers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Silicon Monolithic Integrated Circuits in RF Systems (SiRF), 2012 IEEE 12th Topical Meeting on
  • Conference_Location
    Santa Clara, CA
  • Print_ISBN
    978-1-4577-1317-0
  • Type

    conf

  • DOI
    10.1109/SiRF.2012.6160168
  • Filename
    6160168