• DocumentCode
    3420437
  • Title

    Solving the wafer probing scheduling problem using water flow-like algorithm

  • Author

    Chin-Chih Chang ; Feng-Chia Li

  • Author_Institution
    Dept. of Inf. Manage., Jen-Teh Junior Coll. of Med., Nursing & Manage., Miaoli, Taiwan
  • fYear
    2013
  • fDate
    13-13 July 2013
  • Firstpage
    161
  • Lastpage
    165
  • Abstract
    The wafer probing scheduling problem (WPSP) is a practical generalization of the classical parallel-machine scheduling problem, which has many real-world applications, particularly, in the integrated circuit (IC) manufacturing industry. In the wafer probing factories, the jobs are clustered by their product types. Further, the job processing time depends on the product type, and the machine setup time is sequence dependent on the orders of jobs processed. Hence, it is more difficult to solve than the classical parallel-machine scheduling problem. In this paper, a novel approach, water flow-like algorithm (WFA) is proposed, to tackle this problem. To verify the proposed algorithm, a case study taken from a wafer probing shop floor in an IC manufacturing factory located on the Science-based Industrial Park at Hsinchu, Taiwan. Computational results show that the proposed algorithm performs remarkably well.
  • Keywords
    computational complexity; integrated circuit manufacture; production facilities; scheduling; Hsinchu; IC manufacturing industry; Science-based Industrial Park; Taiwan; WFA; WPSP; integrated circuit manufacturing industry; machine setup time; parallel machine scheduling problem; product type clustering; wafer probing factories; wafer probing scheduling problem; water flow-like algorithm; Algorithm design and analysis; Integrated circuits; Job shop scheduling; Parallel machines; Probes; Processor scheduling; parallel machine scheduling; wafer probing; water flow-like algorithm;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computational Intelligence & Applications (IWCIA), 2013 IEEE Sixth International Workshop on
  • Conference_Location
    Hiroshima
  • ISSN
    1883-3977
  • Print_ISBN
    978-1-4673-5725-8
  • Type

    conf

  • DOI
    10.1109/IWCIA.2013.6624805
  • Filename
    6624805