Title :
From zero- to second-level packaging of RF-MEMS devices
Author :
Jourdain, A. ; Vaesen, Kristof ; Schee, J.M. ; Weekamp, J.W. ; van Beek, J.T.M. ; Tilmans, Harrie A. C.
Author_Institution :
IMEC, Leuven, Belgium
fDate :
30 Jan.-3 Feb. 2005
Abstract :
This paper reports the full packaging and assembly of RF-MEMS devices for operation below 6GHz, comprising 0-level, 1-level and 2-level packaging. The fabrication process for the RF-MEMS devices is based on the Philips PASSI™ process, which is adapted to accommodate the packaging. The 0-level assembly is based on solder bonding, and is realized on a flip-chip aligner/bonder under atmospheric pressure, at 240°C. The 1-level package comprises a chip-scale-package (CSP) in which the 0-level packaged device is directly equipped with solder balls for the interconnect. The individual 1-level assemblies are then flip-chip mounted on a RF-board at 240°C, completing the 2-level packaging. RF measurements of a 2nd-level packaged series switch showed an increase of the insertion loss of about 0.1 dB after 0-level packaging, increasing to about 0.5dB after 2nd-level packaging. Preliminary evaluation of the 0-level package hermeticity using switches configured as mechanical resonators indicates an hermetic seal.
Keywords :
chip scale packaging; flip-chip devices; hermetic seals; microwave devices; semiconductor device packaging; soldering; 0-level package hermeticity; 0-level packaging; 1-level packaging; 2-level packaging; 240 C; Philips PASSI process; RF measurements; RF-MEMS devices; RF-board; atmospheric pressure; chip-scale-package; flip-chip aligner; flip-chip bonder; hermetic seal; individual 1-level assemblies; insertion loss; mechanical resonators; second-level packaging; solder balls; solder bonding,; zero-level packaging; Assembly; Atmospheric measurements; Bonding; Chip scale packaging; Fabrication; Loss measurement; Radio frequency; Radiofrequency microelectromechanical systems; Semiconductor device measurement; Switches;
Conference_Titel :
Micro Electro Mechanical Systems, 2005. MEMS 2005. 18th IEEE International Conference on
Print_ISBN :
0-7803-8732-5
DOI :
10.1109/MEMSYS.2005.1453861