Title :
Accurate full wave analysis of open hemispherical resonators loaded with dielectric layers
Author :
Cwikla, A. ; Mielewski, J. ; Mrozowski, M. ; Wosik, J.
Author_Institution :
Fac. of Electron. Telecommun. & Inf., Tech. Univ. Gdansk, Poland
Abstract :
Rotationally symmetric inhomogeneously loaded open resonators are analyzed using the finite difference frequency domain method. State of the art or entirely new techniques are proposed to achieve high accuracy of numerical computations. These include conformal modeling of boundaries and dielectric interfaces, application of the Arnoldi method combined with FIR digital filters, and numerical dispersion correction. As a result the final solution error is as low as 0.013%.
Keywords :
cavity resonators; dielectric-loaded waveguides; dispersion (wave); finite difference methods; frequency-domain analysis; Arnoldi method; conformal modeling; dielectric interfaces; dielectric layer loading; finite difference frequency domain method; full wave analysis; numerical computations; numerical dispersion correction; open hemispherical resonators; rotationally symmetric inhomogeneously loaded resonators; solution error; Dielectrics; Digital filters; Eigenvalues and eigenfunctions; Finite difference methods; Finite impulse response filter; Frequency; Mirrors; Numerical models; Polynomials; Time domain analysis;
Conference_Titel :
Microwave Symposium Digest, 1999 IEEE MTT-S International
Conference_Location :
Anaheim, CA, USA
Print_ISBN :
0-7803-5135-5
DOI :
10.1109/MWSYM.1999.779617
