• DocumentCode
    3420556
  • Title

    Fabrication and preliminary test results of BICEP (Background Imaging of Cosmic Extragalactic Polarization) bolometer

  • Author

    Bae, Sum Y. ; Yoon, Ki-Won ; George, Thomas

  • Author_Institution
    Jet Propulsion Lab., Pasadena, CA, USA
  • fYear
    2005
  • fDate
    30 Jan.-3 Feb. 2005
  • Firstpage
    60
  • Lastpage
    63
  • Abstract
    We report the results of fabrication and testing for the world\´s most sensitive MEMS bolometer. Our bolometer is designed to map temperature gradients within the cosmic microwave background (CMB). The bolometer is capable of differentiating temperature differences in the CMB that are less than 10 parts per million. The key to this ultrahigh sensitivity is the "spider web" architecture fabricated from a suspended, metallized silicon nitride film. We report the results of fabrication and characterization of a novel spider web bolometer, the so-called BICEP (Background Imaging of Cosmic Extragalactic Polarization), capable of detecting the polarization as well as the intensity of the incident microwave radiation. The bolometer was characterized over a range of sub-Kelvin ambient temperatures. We report the results of the voltage response, time constant, and the "leakage" in the bolometer\´s responsivity to incident microwave polarizations. Finally, from our experimental results we have determined that the bolometer has a low noise equivalent power of 2-10-17W/Hz- 12 /.
  • Keywords
    bolometers; cosmic background radiation; microsensors; temperature measurement; BICEP bolometer; Background Imaging of Cosmic Extragalactic Polarization; MEMS bolometer; SiN; cosmic microwave background; incident microwave polarizations; incident microwave radiation; spider web architecture; spider web bolometer; suspended metallized silicon nitride film; temperature gradients; time constant; voltage response; Bolometers; Fabrication; Metallization; Micromechanical devices; Microwave imaging; Polarization; Service oriented architecture; Silicon; Temperature sensors; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Micro Electro Mechanical Systems, 2005. MEMS 2005. 18th IEEE International Conference on
  • ISSN
    1084-6999
  • Print_ISBN
    0-7803-8732-5
  • Type

    conf

  • DOI
    10.1109/MEMSYS.2005.1453867
  • Filename
    1453867