Finite element realization of ultra-high quality factor frequency-temperature compensated sapphire-rutile whispering gallery mode resonators

Author

Tobar, M.E. ; Cros, D. ; Blondy, P. ; Hartnett, J.G. ; Guillon, P.

Author_Institution

Dept. of Phys., Western Australia Univ., Nedlands, WA, Australia

Volume

3

fYear

1999

fDate

13-19 June 1999

Firstpage

1323

Abstract

To build the highest frequency stable microwave oscillators, high-Q sapphire dielectric resonators must have the temperature coefficient of permittivity annulled. This is achieved by fixing thin slabs of low loss crystalline rutile to the ends of the sapphire cylinder. Rigorous finite element analysis has been applied to this resonator. This has allowed optimization of the structure with respect to designability of the annulment temperature and the amount of spurious modes present.

Keywords

Q-factor; compensation; dielectric resonator oscillators; finite element analysis; frequency stability; microwave oscillators; sapphire; titanium compounds; Al/sub 2/O/sub 3/-TiO/sub 2/; annulment temperature; designability; dielectric resonators; finite element realization; frequency stable microwave oscillators; frequency-temperature compensation; sapphire-rutile whispering gallery mode resonators; spurious modes; structure optimization; temperature coefficient of permittivity; ultra-high quality factor; Crystallization; Design optimization; Dielectrics; Finite element methods; Frequency; Microwave oscillators; Permittivity; Q factor; Slabs; Temperature;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Symposium Digest, 1999 IEEE MTT-S International

Conference_Location

Anaheim, CA, USA

Print_ISBN

0-7803-5135-5

Type

conf

DOI

10.1109/MWSYM.1999.779631

Filename

779631