Title :
On the testability of analog circuits with directive faults: a rule-based solution and an equation check approach
Author :
Kwok, D.P. ; Lu, Q.
Author_Institution :
Dept. of Electron. Eng., Hong Kong Polytech., Kowloon, Hong Kong
Abstract :
The construction of directive topology graphs for analog circuits under test (ACUTs) is discussed. Based on node observability and verifiability for directive faults, some basic rules are given which would improve the testability of the network. An overdetermined equation unified checking method (OEUC) is also presented in an effort to check the testability of directive circuits. The method first decomposes the network by finding all diagnosable overdetermined equations (DOEs) of the system equation and then checks their consistency; verifies unitedly, which can divide components into several sets; and adds some new measurement values for the next test turn if necessary. Such iteration is carried out repeatedly until the fault location level is satisfied. The fault location process this method is similar to the troubleshooting approach of a repair technician but in the form of a mathematical expression and can therefore be automated
Keywords :
analogue circuits; fault location; integrated circuit testing; analog circuits; circuit testing; diagnosable overdetermined equations; directive faults; directive topology graphs; equation check approach; fault location; iteration; measurement; node observability; repair; rule-based solution; testability; verifiability; Analog circuits; Automatic testing; Circuit faults; Circuit testing; Electronic equipment testing; Equations; Fault diagnosis; Observability; System testing; US Department of Energy;
Conference_Titel :
Industrial Electronics, Control, Instrumentation, and Automation, 1992. Power Electronics and Motion Control., Proceedings of the 1992 International Conference on
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-0582-5
DOI :
10.1109/IECON.1992.254369