DocumentCode :
3420801
Title :
Thermally tunable optical thin-film filters with sub-nanometer resolution and 41.7 nm continuous tuning range
Author :
Hohlfeld, Dennis ; Zappe, Hans
Author_Institution :
IMTEK - Inst. of Microsystem Technol., Freiburg Univ., Germany
fYear :
2005
fDate :
30 Jan.-3 Feb. 2005
Firstpage :
100
Lastpage :
103
Abstract :
A MEMS-based, tunable optical filter with a transmission linewidth of 0.28 nm, continuously tu nable over a spectral range of 41.7 nm, is presented. The thin film interference filter employs a solid-state silicon cavity and silicon-based distributed Bragg reflectors (DBR). Tuning is achieved by varying the optical resonator thickness through thermal modulation. The filter is configured as a membrane and operates up to a temperature of 450 °C. Such a filter is essential for monitoring and reconfiguration of optical data communication networks and is also applicable for gas sensing.
Keywords :
distributed Bragg reflectors; interference filters; optical communication; optical films; optical resonators; optical tuning; 41.7 nm; 450 C; MEMS-based optical filter; distributed Bragg reflectors; gas sensing; optical data communication networks; optical resonator thickness; solid-state silicon cavity; thermal modulation; thermally tunable optical filter; thin film interference filter; Distributed Bragg reflectors; Interference; Optical films; Optical filters; Optical resonators; Optical tuning; Resonator filters; Semiconductor thin films; Silicon; Solid state circuits;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Micro Electro Mechanical Systems, 2005. MEMS 2005. 18th IEEE International Conference on
ISSN :
1084-6999
Print_ISBN :
0-7803-8732-5
Type :
conf
DOI :
10.1109/MEMSYS.2005.1453877
Filename :
1453877
Link To Document :
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