• DocumentCode
    342083
  • Title

    Nonlinear FET model for intermodulation distortion analysis of resistive mixers

  • Author

    Fujii, K. ; Hara, Y. ; Yakabe, T. ; Yabe, H.

  • Author_Institution
    Japan Radio Co. Ltd., Tokyo, Japan
  • Volume
    2
  • fYear
    1999
  • fDate
    13-19 June 1999
  • Firstpage
    529
  • Abstract
    This paper describes an improved nonlinear model for predicting an intermodulation distortion (IMD) power characteristic of GaAs FETs in switching applications. The model is capable of modeling the voltage dependent drain current and its derivatives, including gate-source and gate-drain capacitance. The drain current and its derivatives are described by a function of voltage dependent drain conductance. The model parameters are extracted from a measured drain conductance versus gate voltage characteristic of a PHEMT. The IMD power characteristics calculated with the use of the proposed method are compared with experimental data taken from an MMIC resistive mixer. Good agreements over large gate voltages and input power levels are observed.
  • Keywords
    MMIC mixers; capacitance; equivalent circuits; field effect transistor switches; high electron mobility transistors; intermodulation distortion; microwave field effect transistors; nonlinear network analysis; semiconductor device models; GaAs; GaAs FET; IMD analysis; IMD power characteristic prediction; MMIC mixer; PHEMT; gate-drain capacitance; gate-source capacitance; intermodulation distortion analysis; model parameters extraction; nonlinear FET model; resistive mixers; switching applications; voltage dependent drain conductance; voltage dependent drain current; Capacitors; Data mining; Equivalent circuits; FETs; Intermodulation distortion; PHEMTs; Power system modeling; Predictive models; Scattering parameters; Zero voltage switching;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 1999 IEEE MTT-S International
  • Conference_Location
    Anaheim, CA, USA
  • Print_ISBN
    0-7803-5135-5
  • Type

    conf

  • DOI
    10.1109/MWSYM.1999.779817
  • Filename
    779817