DocumentCode
3420941
Title
On fault diagnosis of analog circuits with tolerance using simulated annealing optimization algorithm
Author
Yan, Li ; Xiangying, Weng
Author_Institution
Northwestern Polytech. Univ., Xi´´an, China
fYear
1992
fDate
9-13 Nov 1992
Firstpage
1472
Abstract
The authors extend the numerical annealing algorithm framework presented by S. Kirkpatrick et al. to the case of continuous multidimensional parameter space. The design an efficient parameter inverse simulated annealing (PI-SA) algorithm, and obtain some important theoretical results on continuous annealing algorithm design. They apply the PI-SA optimization algorithm to fault diagnosis of analog circuits with tolerance. A software package for automatic diagnosis has been developed and applied to fault isolation of the electronic equipment of the remotely piloted vehicles. The diagnosis results obtained with the software package both ground simulation and in flight testing are satisfactory
Keywords
aerospace testing; analogue circuits; automatic testing; fault location; integrated circuit testing; simulated annealing; aerospace testing; analog circuits; automatic testing; continuous multidimensional parameter space; design; fault diagnosis; fault isolation; fault location; ground simulation; in flight testing; optimization algorithm; parameter inverse; simulated annealing; software package; tolerance; Algorithm design and analysis; Analog circuits; Circuit faults; Circuit simulation; Electronic equipment; Fault diagnosis; Inverse problems; Multidimensional systems; Simulated annealing; Software packages;
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial Electronics, Control, Instrumentation, and Automation, 1992. Power Electronics and Motion Control., Proceedings of the 1992 International Conference on
Conference_Location
San Diego, CA
Print_ISBN
0-7803-0582-5
Type
conf
DOI
10.1109/IECON.1992.254384
Filename
254384
Link To Document