DocumentCode
3421173
Title
Dynamic compact model of Spin-Transfer Torque based Magnetic Tunnel Junction (MTJ)
Author
Faber, Louis-Barthélemy ; Zhao, Weisheng ; Klein, Jacques-Oliver ; Devolder, Thibaut ; Chappert, Claude
Author_Institution
IEF, CNRS, Orsay
fYear
2009
fDate
6-9 April 2009
Firstpage
130
Lastpage
135
Abstract
The integration of magnetic tunnel junctions (MTJ) above CMOS circuits in embedded magnetic RAM (MRAM) or magnetic FPGA (MFPGA) could bring to digital circuits major advantages associated to non-volatile capability such as instant on/off, multi-context FPGA and zero standby power consumption. A complete simulation model for the hybrid MTJ/CMOS design is presented in this paper. Based on the recently demonstrated spin-transfer torque (STT) writing approach which promises to lower the switching current down to ~120 uA, we have added to the previous static model the dynamic behaviors as well as the switching probability and the thermal effects. The model has been developed in Verilog-A language and implemented on Cadence Virtuoso platform. Many experimental parameters are included in this model to improve the simulation accuracy. Simulations demonstrate that the model can be efficiently used to design hybrid MTJ/CMOS circuits.
Keywords
CMOS logic circuits; MRAM devices; field programmable gate arrays; hardware description languages; magnetic tunnelling; CMOS circuits; MTJ/CMOS design; Verilog-A language; dynamic compact model; embedded magnetic RAM; magnetic FPGA; magnetic tunnel junction; spin-transfer torque; switching current; zero standby power consumption; CMOS digital integrated circuits; Circuit simulation; Digital circuits; Energy consumption; Field programmable gate arrays; Magnetic circuits; Magnetic tunneling; Semiconductor device modeling; Torque; Writing; MRAM; MTJ; STT; dynamic and static behavoirs; high speed; low power; thermal effects;
fLanguage
English
Publisher
ieee
Conference_Titel
Design & Technology of Integrated Systems in Nanoscal Era, 2009. DTIS '09. 4th International Conference on
Conference_Location
Cairo
Print_ISBN
978-1-4244-4320-8
Electronic_ISBN
978-1-4244-4321-5
Type
conf
DOI
10.1109/DTIS.2009.4938040
Filename
4938040
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