DocumentCode :
3421390
Title :
Effect of coder/decoder reliability on bit error rate performance of wireless communication systems
Author :
Cheng, Change-Chi ; Shooman, Martin L. ; Cassara, Frank A.
Author_Institution :
Polytech. Univ., Farmingdale, NY, USA
fYear :
1997
fDate :
5-7 Feb 1997
Firstpage :
117
Lastpage :
124
Abstract :
This paper examines the effect of coder/decoder circuitry failures on the overall performance of a digital wireless information network. A complete system analysis of the error correcting coding scheme performance must include an evaluation of the reliability of the coder/decoder circuitry because their failures also serve as a source of undetected errors. Included in this study are the parity bit code, Hamming single error correcting and detecting code, and the Reed-Solomon code. Results reveal that for applications that require low bit error rate and operate at low data rates, the reliability of the coding circuitry can play a significant role in determining overall system performance. In fact, for such error and data rates, a simpler coding scheme with higher circuit reliability may actually be more beneficial than a more complex coding scheme with enhanced error correcting ability but with a higher chip failure rate
Keywords :
Hamming codes; Reed-Solomon codes; decoding; digital radio; error correction codes; error detection codes; error statistics; integrated circuit reliability; telecommunication network reliability; Hamming code; Reed-Solomon code; bit error rate performance; chip failure rate; circuit reliability; coder/decoder reliability; digital wireless information network; error detecting code; parity bit code; single error correcting code; wireless communication systems; Bit error rate; Circuits; Decoding; Error analysis; Error correction; Error correction codes; Failure analysis; Performance analysis; Reed-Solomon codes; System performance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Performance, Computing, and Communications Conference, 1997. IPCCC 1997., IEEE International
Conference_Location :
Phoenix, Tempe, AZ
Print_ISBN :
0-7803-3873-1
Type :
conf
DOI :
10.1109/PCCC.1997.581488
Filename :
581488
Link To Document :
بازگشت