• DocumentCode
    3421466
  • Title

    EMC Figure of Merit for Receivers

  • Author

    Duff, William G.

  • Author_Institution
    Atlantic Research Corporation a Division of the Susquehanna Corporation Alexandria, Virginia
  • fYear
    1969
  • fDate
    17-19 June 1969
  • Firstpage
    257
  • Lastpage
    262
  • Abstract
    In order to evaluate receiver susceptibility to interference, it is necessary to have some means of measuring and specifying receiver characteristics. One major source of receiver susceptibility information is the spectrum signature measurement program performed under MIL-STD-449C. Although many of the important receiver interference effects result from the same basic cause (i.e., undesired nonlinearities) and are influenced by the same basic factors such as selectivity and gain, under the current spectrum signature measurement program, each type of interference is measured separately as if they were completely unrelated. As a result, it is expensive and time consuming to obtain a complete "spectrum signature" for a receiver. Furthermore, receiver interference specifications have adopted the same general philosophy of treating each of the interference effects separately, and consequently, it is prohibitively expensive and difficult to establish any form of production line EMC quality control. What is desired is a receiver "figure of merit" that is simple to measure and describes the overall susceptibility of a receiver to interference. If this elusive but needed receiver "figure of merit" can be defined, it would provide a basis for receiver EMC specification, measurement, comparison, and quality control. This paper discusses a single receiver parameter that is easily measured, and may be used directly to evaluate receiver susceptibility to desensitization, cross modulation, and intermodulation. Furthermore, because this parameter provides an overall measure of the combined effects of RF selectivity, gain, and nonlinearity, it provides some information on receiver spurious response characteristics.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility Symposium Record, 1969 IEEE
  • Conference_Location
    Asbury Park, NJ, USA
  • ISSN
    0018-9375
  • Type

    conf

  • DOI
    10.1109/TEMC.1969.4307212
  • Filename
    4307212