Title :
A robust approach for automated model generation
Author :
Xia, Likun ; Bell, Ian M. ; Wilkinson, Antony J.
Author_Institution :
Dept. of Eng., Univ. of Hull, Kingston upon Hull
Abstract :
Over the last few years, automated model generation approaches have rapidly gained importance as a sustainable methodology for verification of large, complex mix-signal SoCs (system-on-chips) and SiPs (system-in-packages). In this paper a novel approach termed multiple model generation system using delta operator (MMGSD) is developed for extracting either single-input single-output (SISO) or multiple-input single-output (MISO) macromodels from a SPICE netlist. This model generation process detects nonlinearity through variations in output error. The objective of using delta operator is to achieve transient impulse invariant transform. Examples of the application of MMGSD are presented for simple two-input systems incorporating a two-stage CMOS operational amplifier (op amp). We demonstrate the generated models are able to model various circuits with good accuracy.
Keywords :
CMOS integrated circuits; SPICE; integrated circuit modelling; mixed analogue-digital integrated circuits; operational amplifiers; system-in-package; system-on-chip; MISO model; MMGSD; SISO model; SPICE netlist; automated model generation; complex mix-signal SiP; complex mix-signal SoC; delta operator; multiple model generation system; multiple-input single-output macromodel; nonlinearity; op amp; output error; robust method; single-input single-output macromodel; system-in-package; transient impulse invariant transform; two-input system; two-stage CMOS operational amplifier; Artificial neural networks; Crosstalk; Discrete transforms; Operational amplifiers; Predictive models; Recursive estimation; Robustness; Semiconductor device modeling; Training data; Transfer functions;
Conference_Titel :
Design & Technology of Integrated Systems in Nanoscal Era, 2009. DTIS '09. 4th International Conference on
Conference_Location :
Cairo
Print_ISBN :
978-1-4244-4320-8
Electronic_ISBN :
978-1-4244-4321-5
DOI :
10.1109/DTIS.2009.4938072