Defect characterization in coupled majority-minority QCA gate

Exploring ingenious universal gate structures is of prime importance in cost effective design of QCA (quantum-dot cellular automata) based logic circuits. The 3-input coupled majority-minority (CMVMIN) gate structure, that realizes majority and minority functions simultaneously in its 2-outputs, is such a QCA device that enables area saving implementation of complex logic. This work characterizes the defective behavior of CMVMIN gate based designs, under cell deposition and cell misplacement defects and measures testability of such designs. The fault tolerance capability is further analyzed to evaluate the possible two alternate structures of the 2-output CMVMIN gate.