DocumentCode :
3422389
Title :
Integrating SCREAM micromachined devices with integrated circuits
Author :
Shaw, Kevin A. ; MacDonald, Noel C.
Author_Institution :
Sch. of Electr. Eng., Cornell Univ., Ithaca, NY, USA
fYear :
1996
fDate :
11-15 Feb 1996
Firstpage :
44
Lastpage :
48
Abstract :
We demonstrate the integration of SCREAM MEMS with a conventional, unmodified IC process. After fabricating the ICs, only two additional masks are needed to form the mechanical structure and the patterned metal interconnects. The mechanical structures are high-aspect-ratio beams formed from single-crystal silicon. SCREAM, which stands for single-crystal-silicon reactive etching and metallization, is a low temperature process requiring conventional IC fabrication tools including the following: RIE, PVD, CVD and optical lithography. None of the processing steps expose the wafer to temperatures above 300°C. Also, the MEMS are independent of the substrate doping, and can be used with the substrate that is optimal for a particular IC process. We describe SCREAM as a “Portable” MEMS process. A portable process does not alter the ICs, can be run after the IC process, and does not require modification of commonly available IC processes. To support the claim that SCREAM is a portable process, we built structures on wafers containing industrially fabricated AD712 BiFET opamps. The ICs stayed within specification and the structures demonstrate successful fabrication adjacent to ICs
Keywords :
integrated circuit metallisation; integrated circuit technology; micromechanical devices; operational amplifiers; sputter etching; 300 C; AD712 BiFET opamps; CVD; IC process; MEMS; PVD; RIE; SCREAM micromachined devices; Si; additional masks; high-aspect-ratio beams; integrated circuits; low temperature process; optical lithography; patterned metal interconnects; single-crystal-silicon reactive etching and metallization; substrate doping; Atherosclerosis; Etching; Integrated circuit interconnections; Metallization; Micromechanical devices; Optical device fabrication; Optical interconnections; Photonic integrated circuits; Silicon; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Micro Electro Mechanical Systems, 1996, MEMS '96, Proceedings. An Investigation of Micro Structures, Sensors, Actuators, Machines and Systems. IEEE, The Ninth Annual International Workshop on
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-2985-6
Type :
conf
DOI :
10.1109/MEMSYS.1996.493827
Filename :
493827
Link To Document :
بازگشت