Testing sequential ILA´s

Sequential iterative logic arrays (ILAs) are studied with respect to two problems. First, some sufficient conditions are presented, which, when met, guarantee an upper bound on the size of the test set for the ILA under consideration. Second, procedures are presented for optimally testing and designing ILAs. The arrays are more general than those reported by other researchers and include bilateral and bidimensional arrays of a tetraconnected sequential Mealy-type machine. Octagonally and hexagonally connected arrays also are discussed. The results are very useful for image processing systems