Title :
Enforcing a system model to be negative imaginary via perturbation of Hamiltonian matrices
Author :
Mabrok, Mohamed A. ; Kallapur, Abhijit G. ; Petersen, Ian R. ; Lanzon, Alexander
Author_Institution :
Sch. of Eng. & Inf. Technol., Univ. of New South Wales, Canberra, ACT, Australia
Abstract :
Flexible structure dynamics with collocated force actuators and position sensors lead to negative imaginary (NI) systems. However, in some cases, the models obtained for these systems may not satisfy the NI property. This paper provides a new method for enforcing such models to be NI. The results are based on a study of the spectral properties of related Hamiltonian matrices. A test for the negativity of the imaginary part of a corresponding transfer function matrix is first performed by checking for the existence of imaginary eigenvalues of the associated Hamiltonian matrix. In the presence of imaginary eigenvalues, the system is not NI. In such cases, a first-order perturbation is presented for the precise characterization of frequency bands where violations of the NI property occur. This characterization is then used for the design of an iterative perturbation scheme for state matrices aimed at displacing the imaginary eigenvalues of the Hamiltonian matrix away from the imaginary axis.
Keywords :
eigenvalues and eigenfunctions; iterative methods; transfer function matrices; Hamiltonian matrices perturbation; Hamiltonian matrix imaginary eigenvalues; NI property; first-order perturbation; flexible structure dynamics; force actuators; frequency band characterization; iterative perturbation scheme; negative imaginary systems; position sensors; system model enforcement; transfer function matrix; Computed tomography; Control systems; Eigenvalues and eigenfunctions; Integrated circuit interconnections; Nickel; Stability analysis; Transfer functions; Hamiltonian matrices; Negative imaginary systems; Passivity; Positive real systems;
Conference_Titel :
Decision and Control and European Control Conference (CDC-ECC), 2011 50th IEEE Conference on
Conference_Location :
Orlando, FL
Print_ISBN :
978-1-61284-800-6
Electronic_ISBN :
0743-1546
DOI :
10.1109/CDC.2011.6160286