DocumentCode
3422866
Title
Fabrication and modeling of 3-D self-assembled SOI MEMS controlled by thermal and plastic strains
Author
Iker, F. ; Andre, N. ; Proost, J. ; Pardoen, T. ; Raskin, J.P.
Author_Institution
CeRMiN, Univ. Catholique de Louvain, Louvain-La-Neuvre, Belgium
fYear
2005
fDate
30 Jan.-3 Feb. 2005
Firstpage
459
Lastpage
462
Abstract
Multilayered self-assembled structures are processed based on thin film SOI technology. The assembly relies on the control of the residual stresses building up in multilayered structures undergoing a complete thermal process, including deposition and specific annealing steps. The deflection of multilayered structures made of both elastic and plastic thin films result from the thermal expansion coefficient mismatches and the plastic flow of metallic layers. Finite element simulations confirmed experimental and theoretical results. The process was successfully applied to 3D self-assembled microstructures such as suspended meander inductors and flow sensors.
Keywords
annealing; finite element analysis; internal stresses; micromechanical devices; plastic flow; self-assembly; silicon-on-insulator; thermal expansion; thermal stresses; 3D self-assembled SOI MEMS fabrication; 3D self-assembled SOI MEMS modeling; annealing; deposition; finite element simulations; flow sensors; multilayered structures; plastic strains; residual stresses; suspended meander inductors; thermal expansion coefficient mismatches; thermal strains; thin film SOI technology; Annealing; Assembly; Capacitive sensors; Fabrication; Micromechanical devices; Plastic films; Residual stresses; Strain control; Stress control; Thermal stresses;
fLanguage
English
Publisher
ieee
Conference_Titel
Micro Electro Mechanical Systems, 2005. MEMS 2005. 18th IEEE International Conference on
ISSN
1084-6999
Print_ISBN
0-7803-8732-5
Type
conf
DOI
10.1109/MEMSYS.2005.1453966
Filename
1453966
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