DocumentCode :
3422969
Title :
Investigation of mixed SAC and SnPb solder balls under high speed ball shear and pull tests
Author :
Song, Fubin ; Jiang, Tong ; Lo, Jeffery C C ; Lee, S. W. Ricky ; Newman, Keith
Author_Institution :
Center for Adv. Microsyst. Packaging, Hong Kong Univ. of Sci. & Technol., Hong Kong
fYear :
2009
fDate :
26-29 April 2009
Firstpage :
1
Lastpage :
8
Abstract :
Due to environmental consciousness and legislative regulations, Pb-free solders have been increasingly used for replacement of conventional SnPb solders in the microelectronic industry. However, during the transition period from SnPb to Pb-free solders, some products will potentially consist of mixtures of Pb-free with SnPb solders. This paper presents the results of microstructural analysis of mixed solder joints which are formed by attaching different alloys of solder balls and pastes on the OSP pad finish. The effect of thermal aging on the strength and fracture energy of the mixed solder balls during high speed ball shear/pull tests was also investigated in the study. The test specimens were aged at 125degC for durations of 200, 500 and 1000 hours. The correlations between the solder ball fracture force/energy, failure modes and intermetallic compound (IMC) thickness of the mixed alloy solder joints are also established.
Keywords :
copper alloys; failure analysis; fracture toughness testing; integrated circuit manufacture; shear strength; silver alloys; solders; tin alloys; OSP pad finish; SnAgCu; failure modes; high speed ball shear test; intermetallic compound thickness; lead free solder balls; microelectronic industry; mixed SAC; mixed alloy solder joints; mixed solder joint microstructural analysis; pull test; solder ball fracture energy; solder ball fracture force; temperature 125 C; time 1000 h; time 200 h; time 500 h; transition period; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal, Mechanical and Multi-Physics simulation and Experiments in Microelectronics and Microsystems, 2009. EuroSimE 2009. 10th International Conference on
Conference_Location :
Delft
Print_ISBN :
978-1-4244-4160-0
Electronic_ISBN :
978-1-4244-4161-7
Type :
conf
DOI :
10.1109/ESIME.2009.4938414
Filename :
4938414
Link To Document :
بازگشت