• DocumentCode
    3423418
  • Title

    Moisture induced effects in PoP

  • Author

    Guédon-Gracia, A. ; Feng, W. ; Delétage, J.Y. ; Verdier, F. ; Frémont, H.

  • Author_Institution
    Lab. IMS, Univ. Bordeaux I, Talence
  • fYear
    2009
  • fDate
    26-29 April 2009
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    This paper presents a combined numerical and experimental methodology for predicting moisture-induced effects in Package-on-Package (PoP) assemblies. The hygroscopic warpage of the assembly "PoP" is measured. Its behavior is compared with the individual components "top" and "bottom". The assembly "PoP" absorbs more moisture than the sum of the two individual components, while deforms less than either of the two individual components, which holds much more constrain inside the assembly. In addition, the hygroscopic warpage (20 mum) adds to the thermal warpage (30 mum) for the assembly "PoP", which might lead to more serious reliability problem. Furthermore, a new experimental methodology for prediction of the moisture-induced warpage is validated, and simulation models match the experimental results.
  • Keywords
    assembling; electronics packaging; numerical analysis; hygroscopic warpage; moisture- induced effects; package-on-package assemblies; thermal warpage; Assembly; Digital cameras; Lead; Moisture; Packaging; Predictive models; Routing; Signal design; Temperature; Thermal stresses;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal, Mechanical and Multi-Physics simulation and Experiments in Microelectronics and Microsystems, 2009. EuroSimE 2009. 10th International Conference on
  • Conference_Location
    Delft
  • Print_ISBN
    978-1-4244-4160-0
  • Electronic_ISBN
    978-1-4244-4161-7
  • Type

    conf

  • DOI
    10.1109/ESIME.2009.4938436
  • Filename
    4938436