DocumentCode
3423418
Title
Moisture induced effects in PoP
Author
Guédon-Gracia, A. ; Feng, W. ; Delétage, J.Y. ; Verdier, F. ; Frémont, H.
Author_Institution
Lab. IMS, Univ. Bordeaux I, Talence
fYear
2009
fDate
26-29 April 2009
Firstpage
1
Lastpage
6
Abstract
This paper presents a combined numerical and experimental methodology for predicting moisture-induced effects in Package-on-Package (PoP) assemblies. The hygroscopic warpage of the assembly "PoP" is measured. Its behavior is compared with the individual components "top" and "bottom". The assembly "PoP" absorbs more moisture than the sum of the two individual components, while deforms less than either of the two individual components, which holds much more constrain inside the assembly. In addition, the hygroscopic warpage (20 mum) adds to the thermal warpage (30 mum) for the assembly "PoP", which might lead to more serious reliability problem. Furthermore, a new experimental methodology for prediction of the moisture-induced warpage is validated, and simulation models match the experimental results.
Keywords
assembling; electronics packaging; numerical analysis; hygroscopic warpage; moisture- induced effects; package-on-package assemblies; thermal warpage; Assembly; Digital cameras; Lead; Moisture; Packaging; Predictive models; Routing; Signal design; Temperature; Thermal stresses;
fLanguage
English
Publisher
ieee
Conference_Titel
Thermal, Mechanical and Multi-Physics simulation and Experiments in Microelectronics and Microsystems, 2009. EuroSimE 2009. 10th International Conference on
Conference_Location
Delft
Print_ISBN
978-1-4244-4160-0
Electronic_ISBN
978-1-4244-4161-7
Type
conf
DOI
10.1109/ESIME.2009.4938436
Filename
4938436
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