HPM effects on electronic components and the importance of this knowledge in evaluation of system susceptibility

Author

Göransson, Gunnar

Author_Institution

FOA Defence Res. Establishment, Linkoping, Sweden

Volume

1

fYear

1999

fDate

1999

Firstpage

543

Abstract

Electronic components have been investigated considering HPM effects. This includes the nature and types of effects and also how the parameters (power, frequency etc.) of the microwave radiation will influence the effects. We also looked at differences in susceptibility between different component types, technologies, manufacturers, different samples of the same type, technology and manufacturing etc. The results show that this knowledge is important for testing and assessing system susceptibility

Keywords

CMOS logic circuits; analogue integrated circuits; automatic test equipment; electron device testing; integrated circuit measurement; microwave measurement; radiofrequency interference; transistor-transistor logic; CMOS; HPM effects; RFI; TTL; analog circuits; automatic measurement system; component manufacturers; component technologies; component types; digital logic circuits; electronic components; frequency; microwave modulation; microwave power; microwave radiation; shielding; system susceptibility testing; Cables; Circuit testing; Electronic components; Fixtures; Frequency; Manufacturing; Microwave devices; Microwave measurements; Power measurement; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Electromagnetic Compatibility, 1999 IEEE International Symposium on

Conference_Location

Seattle, WA

Print_ISBN

0-7803-5057-X

Type

conf

DOI

10.1109/ISEMC.1999.812964

Filename

812964