• DocumentCode
    3424068
  • Title

    Constitutive behaviour of copper ribbons used in solar cell assembly processes

  • Author

    Wiese, Steffen ; Meier, Rico ; Kraemer, Frank ; Bagdahn, Joerg

  • Author_Institution
    Fraunhofer Center, Silicon Photovoltaics, Halle
  • fYear
    2009
  • fDate
    26-29 April 2009
  • Firstpage
    1
  • Lastpage
    8
  • Abstract
    One of the driving factors for a steady reduction in wafer and cell thickness is the present shortage of polysilicon feedstock combined with the need to reduce manufacturing costs in photovoltaic module production. Therefore materials and manufacturing processes must adapt to maintain acceptable mechanical yields and module reliability. The soldering of solar cell strings is a critical step in the production of photovoltaic modules. Mechanical load and temperature induced stresses can cause cracking in the cells. During the soldering operation, the cell and the wires heat up and expand and then later contract when the heat is removed below the melting point of the solder. The differential contraction between the Cu and the Si combined with thermal gradients, cause stress to build up in the system. Since the solder thickness (5hellip20 mum) is relatively small compared to thickness of the copper ribbon (100hellip200 mum) and the thickness of the silicon solar cell (160hellip200 mum), the constitutive behaviour of the copper ribbons is one of the key factors to reduce breakage after soldering of solar cells into strings.
  • Keywords
    assembling; copper; cracks; electrical products industry; fracture; reliability; solar cells; soldering; stress analysis; breakage; copper ribbons; cracking; driving factors; manufacturing processes; mechanical yields; module reliability; photovoltaic module production; polysilicon feedstock; solar cell assembly processes; solar cell strings; soldering operation; temperature induced stresses; thermal gradients; Assembly; Copper; Costs; Manufacturing; Photovoltaic cells; Photovoltaic systems; Production; Solar power generation; Soldering; Thermal stresses;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal, Mechanical and Multi-Physics simulation and Experiments in Microelectronics and Microsystems, 2009. EuroSimE 2009. 10th International Conference on
  • Conference_Location
    Delft
  • Print_ISBN
    978-1-4244-4160-0
  • Electronic_ISBN
    978-1-4244-4161-7
  • Type

    conf

  • DOI
    10.1109/ESIME.2009.4938464
  • Filename
    4938464