DocumentCode
3424111
Title
Dynamic study and structure enhancement of small outline dual-in-line memory module
Author
Huang, C.J. ; Chou, C.Y. ; Chiang, K.N.
Author_Institution
Adv. Packaging Res. Center, Nat. Tsing Hua Univ., Hsinchu
fYear
2009
fDate
26-29 April 2009
Firstpage
1
Lastpage
5
Abstract
The purpose of this research is to enhance the structure of the 204-pin small outline dual in-line memory module (SODIMM) against the drop impact. According to the JEDEC regulations, the enhancement of PCB clips should be attempted to increase the resistance against drop impact. From high speed camera observation, the SODIMM module is pushed away from the PCB clips during drop impact. Therefore, the board pushing experiment was performed to measure the resistant force against PCB clips. Thereafter, two stages of finite element analysis (FEA) were executed to improve the resistance force of PCB clips. In the first stage, the finite element model of the SODIMM module was built to calculate the total resistance force against the constraint of PCB clips using FEA software ANSYSreg. The simulation results were validated well with the board pushing experiment. The total resistance force is about 5.39 N in the original design. The second stage of the analysis is to proceed with the structural enhancement of PCB clips. Several parametric studies including discussions on the angle between clip and PCB, the length of the PCB clip, and the material properties of clip, were performed to improve the strength of clips. After the structural optimization, the total resistant force against the constraint of clip increased from 5.39 N to 8 N.
Keywords
finite element analysis; random-access storage; ANSYS; FEA software; JEDEC regulations; PCB clips; drop impact; finite element analysis; material properties; resistance force; small outline dual-in-line memory module; structure enhancement; total resistance force; Cameras; Electrical resistance measurement; Finite element methods; Force measurement; Guidelines; Packaging; Parametric study; Performance evaluation; Sockets; Stress;
fLanguage
English
Publisher
ieee
Conference_Titel
Thermal, Mechanical and Multi-Physics simulation and Experiments in Microelectronics and Microsystems, 2009. EuroSimE 2009. 10th International Conference on
Conference_Location
Delft
Print_ISBN
978-1-4244-4160-0
Electronic_ISBN
978-1-4244-4161-7
Type
conf
DOI
10.1109/ESIME.2009.4938465
Filename
4938465
Link To Document