• DocumentCode
    342420
  • Title

    On dynamic range limitations of CMOS current conveyors

  • Author

    Bruun, Erik

  • Author_Institution
    Dept. of Inf. Technol., Tech. Univ., Lyngby, Denmark
  • Volume
    2
  • fYear
    1999
  • fDate
    36342
  • Firstpage
    270
  • Abstract
    This paper is concerned with the dynamic range of continuous time CMOS current mode circuits. As a representative current mode device a class AB current conveyor is examined. First, the voltage input range of the high impedance Y input is investigated. Next, the current input range of the low impedance X input is investigated. It is compared to the thermal noise in the X to Z signal path in order to evaluate the dynamic range, and the dependencies of the dynamic range on the supply voltage and the transistor layout is derived, both for the situation where the conveyor is used over a narrow frequency band and for the situation where the conveyor is used over the full bandwidth achievable. Finally, the optimisation of the current input range is related to the distortion characteristics and it is pointed out that to a first order approximation the distortion is independent of the current range
  • Keywords
    CMOS analogue integrated circuits; circuit optimisation; current conveyors; current-mode circuits; electric distortion; integrated circuit noise; network analysis; thermal noise; CMOS current conveyors; class AB current conveyor; continuous time current mode circuits; current input range; distortion characteristics; dynamic range limitations; first order approximation; full bandwidth operation; high impedance input; low impedance input; narrow frequency band operation; supply voltage; thermal noise; transistor layout; voltage input range; Bandwidth; Circuit noise; Current mode circuits; Dynamic range; Frequency; Impedance; Information technology; Low voltage; Parasitic capacitance; Signal processing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 1999. ISCAS '99. Proceedings of the 1999 IEEE International Symposium on
  • Conference_Location
    Orlando, FL
  • Print_ISBN
    0-7803-5471-0
  • Type

    conf

  • DOI
    10.1109/ISCAS.1999.780698
  • Filename
    780698