Title :
Transient analysis of minimum duration outage for RF channel in cellular systems
Author :
Ma, Yue ; Han, James J. ; Trivedi, Kishor S.
Author_Institution :
Center for Adv. Comput. & Commun., Duke Univ., Durham, NC, USA
Abstract :
Following Mandayam et al. (1998), we define outage events as the channel being attenuated for at least a deterministic period of time, τm. Compared with a continuous time Markov chain or discrete time Markov chain, a semi-Markov process (SMP) is general enough that it allows the sojourn time to be any distribution function. In this paper, we develop a minimum duration outage model based on an SMP. Closed-form expressions are derived for the time dependent and steady state probabilities of outage. Describing the outage event in the transient regime, our model can reflect the channel fading behavior in a dynamic way
Keywords :
Markov processes; cellular radio; fading channels; telecommunication network reliability; transient analysis; RF channel; cellular systems; channel fading behavior; closed-form expressions; distribution function; minimum duration outage; minimum duration outage model; outage events; semi-Markov process; sojourn time; steady state probability; time dependent probability; transient analysis; Closed-form solution; Communication system software; Computer science; Fading; Land mobile radio cellular systems; Markov processes; Power system modeling; Radio frequency; Steady-state; Transient analysis;
Conference_Titel :
Vehicular Technology Conference, 1999 IEEE 49th
Conference_Location :
Houston, TX
Print_ISBN :
0-7803-5565-2
DOI :
10.1109/VETEC.1999.780699