DocumentCode :
3424564
Title :
Unbiased Metric Learning: On the Utilization of Multiple Datasets and Web Images for Softening Bias
Author :
Chen Fang ; Ye Xu ; Rockmore, Daniel N.
Author_Institution :
Comput. Sci. Dept., Dartmouth Coll., Hanover, NH, USA
fYear :
2013
fDate :
1-8 Dec. 2013
Firstpage :
1657
Lastpage :
1664
Abstract :
Many standard computer vision datasets exhibit biases due to a variety of sources including illumination condition, imaging system, and preference of dataset collectors. Biases like these can have downstream effects in the use of vision datasets in the construction of generalizable techniques, especially for the goal of the creation of a classification system capable of generalizing to unseen and novel datasets. In this work we propose Unbiased Metric Learning (UML), a metric learning approach, to achieve this goal. UML operates in the following two steps: (1) By varying hyper parameters, it learns a set of less biased candidate distance metrics on training examples from multiple biased datasets. The key idea is to learn a neighborhood for each example, which consists of not only examples of the same category from the same dataset, but those from other datasets. The learning framework is based on structural SVM. (2) We do model validation on a set of weakly-labeled web images retrieved by issuing class labels as keywords to search engine. The metric with best validation performance is selected. Although the web images sometimes have noisy labels, they often tend to be less biased, which makes them suitable for the validation set in our task. Cross-dataset image classification experiments are carried out. Results show significant performance improvement on four well-known computer vision datasets.
Keywords :
Internet; computer vision; image classification; image retrieval; learning (artificial intelligence); search engines; support vector machines; UML approach; class label; classification system; cross-dataset image classification experiment; dataset collector preference; downstream effect; generalizable technique construction; hyperparameter variation; illumination condition; imaging system; less-biased candidate distance metrics; model validation; multiple-biased dataset; multiple-dataset utilization; neighborhood learning; noisy label; search engine; softening bias; standard computer vision dataset; structural SVM; training example; unbiased metric learning approach; weakly-labeled Web image retrieval; Coherence; Measurement; Optimization; Silicon; Training; Training data; Unified modeling language; dataset bias; domain generalization; metric learning; web images;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Vision (ICCV), 2013 IEEE International Conference on
Conference_Location :
Sydney, NSW
ISSN :
1550-5499
Type :
conf
DOI :
10.1109/ICCV.2013.208
Filename :
6751316
Link To Document :
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